首页> 外文OA文献 >A closed parameterization of DNA-damage by charged particles, as a function of energy - a geometrical approach.
【2h】

A closed parameterization of DNA-damage by charged particles, as a function of energy - a geometrical approach.

机译:带电粒子对DNA损伤的封闭参数化,作为能量的函数-一种几何方法。

代理获取
本网站仅为用户提供外文OA文献查询和代理获取服务,本网站没有原文。下单后我们将采用程序或人工为您竭诚获取高质量的原文,但由于OA文献来源多样且变更频繁,仍可能出现获取不到、文献不完整或与标题不符等情况,如果获取不到我们将提供退款服务。请知悉。

摘要

PURPOSE: To present a closed formalism calculating charged particle radiation damage induced in DNA. The formalism is valid for all types of charged particles and due to its closed nature is suited to provide fast conversion of dose to DNA-damage. METHODS: The induction of double strand breaks in DNA-strings residing in irradiated cells is quantified using a single particle model. This leads to a proposal to use the cumulative Cauchy distribution to express the mix of high and low LET type damage probability generated by a single particle. A microscopic phenomenological Monte Carlo code is used to fit the parameters of the model as a function of kinetic energy related to the damage to a DNA molecule embedded in a cell. The model is applied for four particles: electrons, protons, alpha-particles, and carbon ions. A geometric interpretation of this observation using the impact ionization mean free path as a quantifier, allows extension of the model to very low energies. RESULTS: The mathematical expression describes the model adequately using a chi-square test ([Formula: see text]). This applies to all particle types with an almost perfect fit for protons, while the other particles seem to result in some discrepancies at very low energies. The implementation calculating a strict version of the RBE based on complex damage alone is corroborated by experimental data from the measured RBE. The geometric interpretation generates a unique dimensionless parameter [Formula: see text] for each type of charged particle. In addition, it predicts a distribution of DNA damage which is different from the current models.
机译:目的:提出一种封闭的形式来计算在DNA中诱导的带电粒子辐射损伤。形式主义对所有类型的带电粒子均有效,并且由于其封闭的性质,适合于将剂量快速转换为DNA损伤。方法:使用单颗粒模型定量分析照射细胞中DNA链中双链断裂的诱导。这导致了一个建议,使用累积柯西分布来表达单个粒子产生的高和低LET类型损坏概率的混合。微观现象学的蒙特卡洛代码用于拟合模型参数,作为动能的函数,动能与嵌入细胞中的DNA分子的损伤有关。该模型适用于四个粒子:电子,质子,α粒子和碳离子。使用碰撞电离平均自由程作为量化器对此观察结果进行几何解释,可以将模型扩展到非常低的能量。结果:该数学表达式使用卡方检验([公式:参见文本])充分描述了该模型。这适用于几乎完全适合质子的所有粒子类型,而其他粒子似乎在非常低的能量下会导致某些差异。仅根据复杂的损坏来计算RBE的严格版本的实现方法得到了来自测得RBE的实验数据的证实。几何解释为每种类型的带电粒子生成唯一的无量纲参数[公式:参见文本]。此外,它可以预测与当前模型不同的DNA损伤分布。

著录项

  • 作者

    Van den Heuvel, F;

  • 作者单位
  • 年度 2014
  • 总页数
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类

相似文献

  • 外文文献
  • 中文文献
  • 专利
代理获取

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号